Automatic Visual Inspection and Image Processing

Lecture, IES, KIT, 2019–2023

This lecture covers the acquisition, description, processing, and evaluation of image data for the purpose of automatic visual inspection. Various sensors and methods for capturing image-based data, as well as the relevant optical principles, are discussed. The mathematical description of image signals is examined in detail. The necessary system-theoretical methods and relationships are derived and discussed. The second half of the lecture focuses on the various sub-tasks and all major signal processing methods used in digital image processing and analysis.